|
型号
|
盒(根)
|
产品描述
|
|
SSS-SEIH
|
10
|
Silicon cantilever
for non-contact/tapping
-mode,special
type A,
with
SUPERSHARPSILICON tip
|
|
20
|
|
50
|
|
SSS-SEIHR
|
10
|
Silicon
cantilever for non-contact/tapping
-mode,special
type A,
with
SUPERSHARPSILICON tip
detector side
: Al-coating
|
|
20
|
|
50
|
|
qp-CONT
|
10
|
生物探针，悬臂梁: 共振频率11kHz 力常数 0.01 N/m; 应用范围：生物探针、液体探针；优势：力常数和共振频率波动范围小，特别适用于的定量纳米力学研究和生物测试
|
|
20
|
|
50
|
|
qp-SCONT
|
10
|
生物探针，悬臂梁: 共振频率11kHz 力常数 0.01 N/m; 应用范围：生物探针、液体探针；优势：力常数和共振频率波动范围小，特别适用于的定量纳米力学研究和生物测试
|
|
20
|
|
50
|
|
PtSi-CONT
|
10
|
导电探针，镀层: 铂硅； 比常规导电探针更耐磨，电学信号更长久，重复性好、分辨率高。应用范围：导电探针
|
|
20
|
|
50
|
|
ATEC-CONT
|
10
|
接触模式硅探针
|
|
20
|
|
50
|
|
ATEC-CONTPt
|
10
|
接触模式硅探针，镀层：Pt/Ir
|
|
20
|
|
50
|
|
ATEC-CONTAu
|
10
|
接触模式探针，臂梁及针尖镀层：镀金
|
|
ppp-CONT
|
10
|
接触模式探针，
|
|
20
|
|
50
|
|
PPP-CONT-W
|
380
|
|
PPP-CONTR
|
10
|
接触模式探针，镀层：Al
|
|
20
|
|
50
|
|
PPP-CONTR-W
|
380
|
|
PPP-XYCONTR
|
10
|
接触模式探针，镀层：Al ,XY-auto aligment
|
|
20
|
|
50
|
|
PPP-CONTPt
|
10
|
Silicon
cantilever for contact mode, detector
side :Pt/Ir-coating ,tip side : Pt/Ir-coating
|
|
20
|
|
50
|
|
PPP-CONTPt-W
|
380
|
|
PPP-CONTAu
|
10
|
Silicon
cantilever for contact mode, detector
and tip side : Au-coating
|
|
PPP-CONTAuD
|
10
|
Silicon
cantilever for contact mode, detector
side : Au-coating
|
|
DT-CONTR
|
10
|
金刚石探针，接触模式，镀层：Al
|
|
20
|
|
50
|
|
CDT-CONTR
|
10
|
导电金刚石探针，接触模式，镀层：Al
|
|
20
|
|
50
|
|
PPP-ZEILR
|
10
|
silicon
cantilever for contact mode, special type, detector side :Al-coating
|
|
20
|
|
50
|
|
PPP-ZEILR-W
|
380
|
|
PPP-RT-CONTR
|
10
|
silicon
cantilever for contact mode, tip rotated by 180°,detector
side :Al-coating
|
|
20
|
|
50
|
|
PL2-CONT
|
10
|
Silicon-SPM-Probe
with plateau tip, silicon cantilever for contact mode,
|
|
PL2-CONTR
|
10
|
Silicon-SPM-Probe
with plateau tip, silicon cantilever for contact mode, detector side:
Al-coating
|
|
TL-CONT
|
10
|
Tipless
silicon cantilever based on POINTPROBE technology
|
|
20
|
|
50
|
|
PPP-CONTSC
|
10
|
silicon cantilever
for contact mode, short cantilever
|
|
20
|
|
50
|
|
PPP-CONTSCR
|
10
|
silicon
cantilever for contact mode, short cantilever, detector side :Al-coating
|
|
20
|
|
50
|
|
PPP-CONTSCR-W
|
380
|
|
PPP-CONTSCPt
|
10
|
silicon
cantilever for contact mode, short cantilever, detector side :Pt/Ir-coating
|
|
20
|
|
50
|
|
PPP-CONTSCAu
|
10
|
silicon
cantilever for contact mode, short cantilever, detector and tip side
:Au-coating
|
|
PPP-CONTSCAuD
|
10
|
silicon
cantilever for contact mode, short cantilever, detector side :Au-coating
|
|
PtSi-FM
|
10
|
导电探针，镀层: 铂硅； 比常规导电探针更耐磨，电学信号更长久，重复性好、分辨率高。应用范围：导电探针
|
|
20
|
|
50
|
|
ATEC-FM
|
10
|
软轻敲探针，镀层: 无； 针尖可视的探针，可应用到对于那些针尖需要被精确定位或必须针尖可见的应用（例如，用于纳米操作）来说，ATEC是必然的首选。由于其超小的半锥角尖端，ATEC系列产品在陡峭的小尺寸图案样品测量中表现出很好的性能. Silicon cantilever for force modulation mode,
|
|
20
|
|
50
|
|
ATEC-EFM
|
10
|
Silicon
cantilever for force modulation mode, detector and tip side:Pt/Ir-coating
|
|
20
|
|
50
|
|
ATEC-FMAu
|
10
|
Silicon
cantilever for force modulation mode, detector and tip side:Au-coating
|
|
PPP-LFMR
|
10
|
Silicon cantilever
for lateral/friction force microscopy,detector side: Al-coating
|
|
20
|
|
50
|
|
PPP-LFMR-W
|
380
|
|
PPP-FM
|
10
|
Silicon
cantilever for force modulation mode,
|
|
20
|
|
50
|
|
PPP-FM-W
|
380
|
|
PPP-FMR
|
10
|
Silicon
cantilever for force modulation mode, detector side:Al-coating
|
|
20
|
|
50
|
|
PPP-FMR-W
|
380
|
|
PPP-FMAu
|
10
|
Silicon
cantilever for force modulation mode,
detector and
tip side: Au-coating
|
|
PPP-FMAuD
|
10
|
Silicon
cantilever for force modulation mode,
detector side: Au-coating
|
|
PPP-QFMR
|
10
|
Silicon
cantilever for force modulation mode,
High quality
factor for UHV applications, detector side: Al-coating
|
|
PPP-RT-FMR
|
10
|
Silicon
cantilever for force modulation mode,
Tip rotated by
180°,detector side: Al-coating
|
|
20
|
|
50
|
|
PL2-FM
|
10
|
Silicon-SPM-Probe
with plateau tip, Silicon cantilever for force modulation mode,
|
|
PL2-FMR
|
10
|
Silicon-SPM-Probe
with plateau tip, Silicon cantilever for force modulation mode, detector
side:Al-coating
|
|
TL-FM
|
10
|
Tipless
silicon cantilever based on POINTPROBE technology
|
|
20
|
|
50
|
|
SSS-FM
|
10
|
Silicon
cantilever for force modulation mode,
With
SUPERSHARPSILICON tip
|
|
20
|
|
50
|
|
SSS-FMR
|
10
|
Silicon
cantilever for force modulation mode,
With
SUPERSHARPSILICON tip,
detector
side:Al-coating
|
|
20
|
|
50
|
|
DT-FMR
|
10
|
金刚石探针，Silicon
cantilever for force modulation mode, 镀层：Al
|
|
20
|
|
50
|
|
CDT-FMR
|
10
|
导电金刚石探针，Silicon cantilever for force modulation mode, 镀层：Al
|
|
20
|
|
50
|
|
PPP-EFM
|
10
|
Silicon
cantilever for electrostatic force Microscopy, detector side:Pt/Ir-coating ,
tip side: Pt/Ir-coating
|
|
20
|
|
50
|
|
PPP-EFM-W
|
370
|
|
PPP-MFMR
|
10
|
Silicon
cantilever for Magnetic force Microscopy, detector side:Al-coating , tip
side: hard magnetic coating
|
|
20
|
|
50
|
|
PPP-MFMR-W
|
370
|
|
PPP-LM-MFMR
|
10
|
Silicon
cantilever for Magnetic force Microscopy, Low Moment ,detector
side:Al-coating , tip side: hard magnetic coating
|
|
20
|
|
50
|
|
PPP-LC-MFMR
|
10
|
Silicon
cantilever for Magnetic force Microscopy, Low Coercivity ,detector
side:Al-coating , tip side: hard magnetic coating
|
|
20
|
|
50
|
|
PPP-QLC-MFMR
|
10
|
Silicon
cantilever for Magnetic force Microscopy, Low Coercivity ,high quality factor
for UHV applications,detector side:Al-coating , tip side: hard magnetic
coating
|
|
SSS-MFMR
|
10
|
Silicon
cantilever for high resolution Magnetic force Microscopy, detector
side:Al-coating , tip side: hard magnetic coating
|
|
20
|
|
50
|
|
SSS-QMFMR
|
10
|
Silicon
cantilever for Magnetic force Microscopy, ,high quality factor for UHV
applications,detector side:Al-coating , tip side: hard magnetic coating
|
|
2D200
|
1
|
CALIBRATION
STANDARD for x-y calibration of the scanning mechanism,lattice of inverted
pyramids,200nm pitch
|
|
2D300
|
1
|
CALIBRATION
STANDARD for x-y calibration of the scanning mechanism,lattice of inverted
pyramids,300nm pitch
|
|
H8
|
1
|
HEIGHT
STANDARD for very precise z-calibration,nominal step height: 8nm
|
|
FLAT
|
1
|
FLATNESS
STANDARD for analysis and correction of the scanner bow,smooth plane with a
maximum peak to valley distance of 10nm on a 100x100u㎡ area
|
